Crystallography Beamline Automation: Work smarter, not harder (October 2003)

The purpose of this workshop was the introduction of new technologies for high-throughput crystallography at synchrotrons, with a focus focusing on the benefits and concerns of general users.

• Announcement and detailed schedule
• Discussion topics

Power point presentations

Sample Mounting Systems

• Thomas Earnest (ALS)
• Aina Cohen (SSRL)

Automated Crystal Centering

• James Holton (ALS)
• Tim McPhillips (SSRL)

Data Backup

• James Holton (ALS)
• Ken Sharp

Crystal Screening Interfaces

• Ana Gonzalez (SSRL)
• Nick Sauter (ALS)