Data

We routinely run a few standard samples to characterize the beamline and calibrate the diffractometer.  The data thus collected is available through the links below.
 

Lanthanum Hexaboride powder (LaB6) epoxied on to a 1 inch square glass slide is used as a standard on beamline 2-1.  The sample was obtained from GEM Dugout.  The lattice parameter of the sample was found to be 4.1566 Å. (It was referenced against Si powder - NIST SRM 640b.)  We routinely use this flat plate to calibrate the wavelength and the 2q zero offset .  The diffractometer resolution functions were obtained from this sample.  We also use this sample to determine the instrumental profile parameters for a Reitveld type full profile analysis.

LaB6 crystallizes in Pm-3m.  La atoms occupy the Wycoff sites 1a at (0 0 0)
                                            B atoms occupy the Wycoff sites 6f at (0.1933 0.5 0.5)

Datasets are available as either:


Silicon (Si) - We use NIST standard reference material 640b mounted into a 0.3mm glass capilliary to calibrate the wavelength and diffractometer zero.

Si crystallizes in Fd-3m

Datasets are available as either: